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1

Sn whiskers: material, design, processing, and post-plate reflow effects and development of an overall phenomenological theory

Osenbach, J.W., Shook, R.L., Vaccaro, B.T., Potteiger, B.D., Amin, A.N., Hooghan, K.N., Suratkar, P., Ruengsinsub, P.

Journal:

IEEE Transactions on Electronics Packaging Manufacturing

Year:

2005

Language:

english

File:

PDF, 8.69 MB

english, 2005

2

Ti/Au Die Backside Metallization for Flip Chip Heat Spreader Attachment

Yuquan Li, Johnson, R.W., Zhang, R., Henson, P., Thompson, P., Hooghan, T., Libres, J.

Journal:

IEEE Transactions on Electronics Packaging Manufacturing

Year:

2010

Language:

english

File:

PDF, 5.18 MB

english, 2010

3

Switchable pH-Responsive Polymeric Membranes Prepared via Block Copolymer Micelle Assembly

Nunes, Suzana P., Behzad, Ali Reza, Hooghan, Bobby, Sougrat, Rachid, Karunakaran, Madhavan, Pradeep, Neelakanda, Vainio, Ulla, Peinemann, Klaus-Viktor

Journal:

Year:

2011

Language:

english

File:

PDF, 2.58 MB

english, 2011

4

Physical Failure Analysis Deprocessing and Cross-Section Techniques for Cu/Low-k Technology

Wu, H., Hooghan, K., Cargo, J.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2004

Language:

english

File:

PDF, 534 KB

english, 2004

5

[IEEE IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (7-11 July 2003)] Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003 - Physical Failure Analysis techniques for Cu/low k technology

Huixian Wu,, Hooghan, B., Cargo, J.

Year:

2003

Language:

english

File:

PDF, 623 KB

english, 2003

6

Study of the interfacial reactions between a bioactive apatite–mullite glass–ceramic coating and titanium substrates using high angle annular dark field transmission electron microscopy

Kenneth T. Stanton, Kevin P. O’Flynn, Shohei Nakahara, Jean-François Vanhumbeeck, John M. Delucca, Bobby Hooghan

Journal:

Journal of Materials Science: Materials in Medicine

Year:

2009

Language:

english

File:

PDF, 525 KB

english, 2009

7

Energy-filtered electron backscatter diffraction

Andrew Deal, Tejpal Hooghan, Alwyn Eades

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 854 KB

english, 2008

8

Energy-filtered electron backscatter diffraction: A correction

Andrew Deal, Tejpal Hooghan, Alwyn Eades

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 75 KB

english, 2008

9

Observation of amorphous chromium in modified C4 flip chip solder joints after thermal stress testing

T.K Hooghan, S Nakahara, K Hooghan, R.W Privette, M.A Bachman, R.S Moyer

Journal:

Thin Solid Films

Year:

2003

Language:

english

File:

PDF, 1.45 MB

english, 2003

10

From Micelle Supramolecular Assemblies in Selective Solvents to Isoporous Membranes

Nunes, Suzana P., Karunakaran, Madhavan, Pradeep, Neelakanda, Behzad, Ali Reza, Hooghan, Bobby, Sougrat, Rachid, He, Haoze, Peinemann, Klaus-Viktor

Journal:

Year:

2011

Language:

english

File:

PDF, 2.75 MB

english, 2011

11

Ultraporous Films with Uniform Nanochannels by Block Copolymer Micelles Assembly

Nunes, Suzana P., Sougrat, Rachid, Hooghan, Bobby, Anjum, Dalaver H., Behzad, Ali Reza, Zhao, Lan, Pradeep, Neekalanda, Pinnau, Ingo, Vainio, Ulla, Peinemann, Klaus-Viktor

Journal:

Year:

2010

Language:

english

File:

PDF, 3.22 MB

english, 2010

12

Linear viscoelasticity in aluminum thin films

Hyun, Seungmin, Hooghan, Tejpal K., Brown, Walter L., Vinci, Richard P.

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 551 KB

english, 2005

13

[IEEE 2000 50th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 2000)] 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) - Assessment of flip chip interconnect integrity using scanning acoustic microscopy

Wolf, R.K., Hooghan, T.K., Bachman, M.A., Weachock, R.J.

Year:

2000

Language:

english

File:

PDF, 1.15 MB

english, 2000

14

[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - Reliability of flip chip packages with high thermal conductivity heat spreader attach

Yuquan Li,, Johnson, R. Wayne, Thompson, Patrick, Hooghan, Tejpal, Libres, Jeremias

Year:

2008

Language:

english

File:

PDF, 1.49 MB

english, 2008

15

A study of a low copper dental amalgam by analytical transmission electron microscopy

Hooghan, Tejpal Kaur, Pinizzotto, Russell F., Watkins, John H., Okabe, Toru

Journal:

Journal of Materials Research

Year:

1996

Language:

english

File:

PDF, 449 KB

english, 1996

16

An Energy Filter for Electron Backscattering Diffraction

Hooghan, T K, Staib, Philippe, Eades, Alwyn

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 351 KB

english, 2004

17

Microscopy of Materials Used in the Semiconductor Industry

Merchant, S M, DeLucca, J M, Hooghan, K N, Baiocchi, F A

Journal:

Microscopy and Microanalysis

Year:

2005

Language:

english

File:

PDF, 590 KB

english, 2005

18

SEM-FIB Characterization of Reverse Osmosis Membrane Fouling

Behzad, A, Hooghan, K, Aubry, C, Khan, M, Croue, J

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 561 KB

english, 2011

19

Analysis of Fouled RO Membranes Using Analytical STEM

Anjum, D, Sougrat, R, Hooghan, B, Khan, M, Croue, J, Behzad, A

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 460 KB

english, 2011

20

[Society of Petroleum Engineers SPE Reservoir Characterization and Simulation Conference and Exhibition - Abu Dhabi, UAE (2013-09-16)] SPE Reservoir Characterization and Simulation Conference and Exhibition - Use of Digital Imaging for Improved Evaluation of Unconventional Reservoirs

Schwartz, Angela, Smart, Erin, Dixon, Michael, Newton, Barry, Hooghan, Kultaransingh (Bobby)

Language:

english

File:

PDF, 1.17 MB

english

21

Multi-modal SEM Imaging for Shale Reservoir Characterization

Hathon, Lori A., Myers, Michael T., Dixon, Mike, Hooghan, Kultaransingh

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 307 KB

english, 2017

22

Microstructural Analysis of the Transformation of Organic Matter during Artificial Thermal Maturation of the Upper Cretaceous Boquillas (Eagle Ford) Formation, Texas, USA

Camp, Wayne K., Knowles, Wayne, Hooghan, Kultaransingh, Ruble, Tim E.

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 277 KB

english, 2017

23

[American Association of Petroleum Geologists Unconventional Resources Technology Conference - Denver, Colorado, USA (2014.08.25-2014.08.27)] Proceedings of the 2nd Unconventional Resources Technology Conference - Protocol for Finalizing Locations for FIB/SEM Cubes on Shale Samples: General Guidelines with Up Scaling in Mind.

Hooghan, Kultaransingh N., Dixon, Michael L., Hathon, Lori

Year:

2014

Language:

english

File:

PDF, 873 KB

english, 2014

24

Organic Matter Characterization in Shales: A Systematic Empirical Protocol

Hooghan, Kultaransingh, Hathon, Lori, Dixon, Mike, Myers, Mike

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 709 KB

english, 2017